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DeVry Technical Institute

 Organization

Found in 100 Collections and/or Records:

A.C. Circuits, [1959]

 Sub-Series
Scope and Contents

Sub-series I-D-vii consists of homework, bi-weekly quizzes, quizzes, and exams for A.C. Circuits.

Dates: [1959]

Analog Computers I, [1960]

 Sub-Group
Scope and Contents

Sub-series I-D-xix consists of class notes and tests for Analog Computers I.

Dates: [1960]

Automation Systems, [1960]

 Sub-Series
Scope and Contents

Sub-series I-D-xxv consists of tests for Automation Systems.

Dates: [1960]

Bi-Weekly Exams , [1959]

 File
Scope and Contents From the Sub-Series:

Sub-series I-D-iii consists of bi-weekly quizzes, quizzes, bi-weekly exams, notes, and tests for Mathematics I and II.

Dates: [1959]

Bi-Weekly Quizes , [1959]

 File
Scope and Contents From the Sub-Series:

Sub-series I-D-iii consists of bi-weekly quizzes, quizzes, bi-weekly exams, notes, and tests for Mathematics I and II.

Dates: [1959]

Bi-Weekly Quizzes, 1959

 File
Scope and Contents From the Sub-Series:

Sub-series I-D-V consists of homework, daily quizzes, bi-weekly quizzes, and notes for Electronic Engineering I.

Dates: 1959

Bi-Weekly Quizzes, [1959]

 File
Scope and Contents From the Sub-Series:

Sub-series I-D-vii consists of homework, bi-weekly quizzes, quizzes, and exams for A.C. Circuits.

Dates: [1959]

Bi-Weekly Quizzes, [1960]

 File
Scope and Contents From the Sub-Series:

Sub-series I-D-x consists of class notes and quizzes for Engineering Electronics II.

Dates: [1960]

Bi-Weekly Tests, [1959-1960]

 File
Scope and Contents From the Sub-Series:

Sub-series I-D-xv consists of tests from Radar III.

Dates: [1959-1960]

Bi-weekly Tests, [1959]

 File
Scope and Contents From the Sub-Series:

Sub-series I-D-ix consits of models and tests for Radar II.

Dates: [1959]

Additional filters:

Type
Archival Object 99
Collection 1